Detalhes do Artigo
[303658] Evaluating TERS as a Metrological Tool for the Determination of the Number of Graphene Layers at Nanoscale
Autores: Juan David Caicedo, Tales F.S. Dias, Thiago L. Vasconcelos, Braulio S. Archanjo
Resumo: This paper presents a comparative analysis of adjacent single and bilayer graphene samples using micro-Raman spectroscopy and tip enhancement Raman spectroscopy (TERS) techniques. The measurements were carried out close to the diffraction limit, enabling a highly accurate characterization of the graphene layers by TERS and micro-Raman Spectroscopy. Hence, TERS experiments yield significantly improved reliability, ensuring more accurate results since it reduced the region where the number of layers are unknown from around 500 nm for micro-Raman, with 1.4 N.A. objective, to around 60 nm for TERS.